Cumpson, P J; Hedley, J* (2003) Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI. Nanotechnology, 14. pp. 1279-1288.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3388