Clifford, C A; Cumpson, P J; Seah, M P (2004) Nano-analysis using Atomic Force Microscopy. VAM Bulletin, 31. pp. 21-25.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3356