Seah, M P; Spencer, S J (2003) Ultra-thin SiO2 on Si: IV, thickness linearity and intensity measurements in XPS. Surf. Interface Anal., 35. pp. 515-524.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/2814