Seah, M P (2002) Quantitative AES and XPS: tests of theory using AES and XPS databases with REELS background subtraction. Journal of Surface Analysis, 9. pp. 275-280.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/2811