Campos, J*; Fontecha, J L*; Pons, A*; Hanson, A; Williams, D; Verrill, J (2000) NPL-CSIC comparison of regular reflectance measurements. Metrologia, 37 (4). pp. 323-327.

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Item Type:	Article
Subjects:	Optical Radiation and Photonics Optical Radiation and Photonics > Materials and Appearance
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/2343