Leach, R K (2000) Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV. Meas. Sci. Technol., 11. pp. 1162-1173.

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Abstract

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Item Type:	Article
Keywords:	surface texture measurement, traceability, interferometry
Subjects:	Nanoscience Nanoscience > Nano-Dimensional
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/1917