Leach, R K (2000) NanoSurf IV: Traceable measurement of surface texture. In: Xth International Conference on Surfaces., Jan 2000, Chemnitz, Germany.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Subjects: | Nanoscience Nanoscience > Nano-Dimensional |
| Last Modified: | 02 Feb 2018 13:17 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/1911 |
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