Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2001) Advances in traceable nanometrology at the National Physical Laboratory. Nanotechnology, 12. pp. R1-R6.
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Nano-Dimensional |
| Last Modified: | 02 Feb 2018 13:17 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/1804 |
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