Jennett, N M; Meneve, J* (1998) Depth sensing indentation of thin hard films: a study of modulus measurement sensitivity to indentation parameters. In: Fundamentals of Nanodentation and Nanotribology Symposium, 13-17 April 1998, San Francisco, USA.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Nanoscience Nanoscience > Nano-Materials
Last Modified:	02 Feb 2018 13:18
URI:	https://eprintspublications.npl.co.uk/id/eprint/1407