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Raman and XRD characterisation microstructure and microwave loss in YBCO 123 thin films.

Cowie, A; Cohen, L F*; Gibson, G; Li, Y H*; MacManus-Driscoll, J*; Gallop, J C (1997) Raman and XRD characterisation microstructure and microwave loss in YBCO 123 thin films. Appl. Supercond.. pp. 53-56.

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Abstract

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Item Type: Article
Subjects: Quantum Phenomena
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/933

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