Naresh-Kumar, G.; Alasmari, A.; Kusch, G.; Edwards, P.R.; Martin, R.W.; Mingard, K.P.; Trager-Cowan, C. (2020) Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope. Ultramicroscopy, 213. 112977 ISSN 03043991
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Official URL: https://doi.org/10.1016/j.ultramic.2020.112977
Item Type: | Article |
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Subjects: | Advanced Materials > Microstructural Characterisation |
Divisions: | Engineering |
Identification number/DOI: | 10.1016/j.ultramic.2020.112977 |
Last Modified: | 13 Oct 2020 14:11 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/8886 |
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