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The residual errors of multiport VNA measurements due to non-ideal TRM calibration.

Wang, M*; Zhao, Y*; Zhou, Y*; Loh, T H (2017) The residual errors of multiport VNA measurements due to non-ideal TRM calibration. In: 2017 International Workshop on Electromagnetism (iWEM), 30 May - 1 June 217, London, UK.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > Wireless Communications
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1109/iWEM.2017.7968815
Last Modified: 02 Feb 2018 13:12
URI: http://eprintspublications.npl.co.uk/id/eprint/7665

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