Mingard, K P; Cox, D C; Jones, H G; Gee, M G (2016) The use of focused ion beam microscopy for 3D material characterisation. Measurement Good Practice Guide. 141

Text (Measurement Good Practice Guide No. 141) MGPG141.pdf - Published Version Download (5MB)

Abstract

This Good Practice Guide to using dual-beam microscopes for materials characterisation has been written by the National Physical Laboratory (NPL). Its main objectives are as follows:

Item Type:	Report/Guide (Measurement Good Practice Guide)
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/7306

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