Gregory, A P; Blackburn, J F; Lees, K; Clarke, R N; Hodgetts, T E*; Hanham, S M*; Klein, N* (2016) Measurement of the permittivity and loss of high-loss materials using a near-field scanning microwave microscope. Ultramicroscopy, 161. pp. 137-145.

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Abstract

Measurements on polar liquids are made to demonstrate that accurate measurements of dielectric loss can be made using a Near-Field Scanning Microwave Microscope (NSMM). The instrument described uses a wire probe that is electromagnetically coupled to a resonant cavity. An optical beam deflection system is incorporated within the instrument to allow contact mode between samples and the wire tip to be obtained. Liquids are contained in a measurement cell with a window of ultrathin glass. The calibration process the Laplacian `complex frequency' in the image-charge model to enable loss to be determined. It is demonstrated that accurate measurements of the loss of the polar liquids can be obtained following calibration against single-crystal specimens that have very low loss.

Item Type:	Article
Subjects:	Electromagnetics Advanced Materials Electromagnetics > Electromagnetic Materials Advanced Materials > Functional Materials Nanoscience > Nano-Materials
Identification number/DOI:	10.1016/j.ultramic.2015.11.015
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/6946

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