Davidson, S (2015) EMRP SIB05 deliverable 1.1.3 Evaluation of heat treated silicon samples for surface properties and charge retention. NPL Report. ENG 62
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Abstract
No abstract available
Item Type: | Report/Guide (NPL Report) |
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NPL Report No.: | ENG 62 |
Keywords: | silicon, surface oxide, hardness, static charge |
Subjects: | Engineering Measurements Engineering Measurements > Mass, Force, Pressure |
Last Modified: | 02 Feb 2018 13:13 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/6871 |
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