Davidson, S (2015) EMRP SIB05 deliverable 1.1.3 Evaluation of heat treated silicon samples for surface properties and charge retention. NPL Report. ENG 62

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Item Type:	Report/Guide (NPL Report)
NPL Report No.:	ENG 62
Keywords:	silicon, surface oxide, hardness, static charge
Subjects:	Engineering Measurements Engineering Measurements > Mass, Force, Pressure
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/6871