Burke, T*; Leach, R K; Boyd, R; Gee, M G; Roy, D; Yacoot, A; Ulrich-Danzebrink, H*; Dziomba, T*; Koenders, L*; Depero, L E*; Carneiro, K*; Dirschel, K*; Morazzani, V*; Lausmaa, J*; Pendrill, L*; Pidduck, A*; Roebben, G*; Sánchez, A*; Unger, W E S*; Proykova, A* (2011) European Nanometrology 2020. Technical Report. Co-Nanomet.

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Item Type:	Report/Guide (Technical Report)
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Publisher:	Co-Nanomet
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/5264