Yang, L; Shard, A G; Lee, J L S; Ray, S (2010) Predicting the wettability of patterned ITO surface using ToF-SIMS images. Surf. Interface Anal., 42 (6-7). pp. 911-915.
Full text not available from this repository.Abstract
No abstract available
| Item Type: | Article | 
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis | 
| Last Modified: | 02 Feb 2018 13:15 | 
| URI: | https://eprintspublications.npl.co.uk/id/eprint/4762 | 
|  | 
 Tools
 Tools Tools
 Tools