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Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip.

Brown, E; Hao, L; Cox, D C; Gallop, J C (2008) Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip. J. Phys., Conf. Ser., 100 (5). 052012

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Abstract

No abstract available

Item Type: Article
Subjects: Engineering Measurements
Engineering Measurements > Thermal
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4613

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