Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2005) Reconstruction of continuous surface profiles from discretely sampled data. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.
Full text not available from this repository.Abstract
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Keywords: | surface roughness |
| Subjects: | Engineering Measurements Engineering Measurements > Dimensional |
| Last Modified: | 02 Feb 2018 13:16 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/3177 |
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