Leach, R K; Cui, Z*; Flack, D R (2003) Microsystems technology standardisation roadmap. Technical Report. NPL, UK.

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Item Type:	Report/Guide (Technical Report)
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Publisher:	NPL, UK
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/2794