< back to main site


A practical guide to wavelets for metrology.

Lord, G J; Pardo-Iguzquiza, E; Smith, I M (2000) A practical guide to wavelets for metrology. NPL Report. CMSC 02/00

[img] Text

Download (3MB)


This report aims to give a brief introduction to wavelet analysis and to identify its relevance to areas of metrology. Wavelets provide an economical basis for a wide range of applications as well as offering simultaneously a time and frequency analysis of a signal. Wavelets should not be viewed as a stand-alone tool but as a complementing and supplementing well established techniques.

Item Type: Report/Guide (NPL Report)
NPL Report No.: CMSC 02/00
Subjects: Mathematics and Scientific Computing
Mathematics and Scientific Computing > Modelling
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/1611

Actions (login required)

View Item View Item