Lord, G J; Pardo-Iguzquiza, E; Smith, I M (2000) A practical guide to wavelets for metrology. NPL Report. CMSC 02/00

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Abstract

This report aims to give a brief introduction to wavelet analysis and to identify its relevance to areas of metrology. Wavelets provide an economical basis for a wide range of applications as well as offering simultaneously a time and frequency analysis of a signal. Wavelets should not be viewed as a stand-alone tool but as a complementing and supplementing well established techniques.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	CMSC 02/00
Subjects:	Mathematics and Scientific Computing Mathematics and Scientific Computing > Modelling
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/1611