Shin, Sang-Hee; Lucyszyn, Stepan; Ridler, N M (2026) Simulation-Based Calibration Verification for (Sub-)Terahertz S -Parameter Measurements. IEEE Transactions on Instrumentation and Measurement, 75. 8001405 ISSN 0018-9456

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Abstract

This article presents a cost-effective method for verifying (sub-)terahertz scattering (S-)parameter measurements using a vector network analyzer (VNA) with frequency extension modules. The approach reduces the need for physical standards with rigorous dimensional characterization by using full-wave electromagnetic (EM) simulation to create a “simulation-driven reference model” with a predictable uncertainty envelope. This method utilizes the known manufacturing tolerances of generic waveguide sections to generate a pass/fail verification bound. Two simple, calculable waveguide devices (a cross-connected line and reduced-aperture sections) are characterized in the WM-570 (330–500 GHz) band. Excellent agreement is achieved between the EM-simulated predictions and VNA-measured S-parameters, with the measurements falling within the calculated uncertainty bounds. This work demonstrates that combining simple hardware with EM simulation is a reliable and low-cost approach for validating S-parameter measurements and calibrations at terahertz frequencies.

Item Type:	Article
Subjects:	Electromagnetics > Terahertz
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1109/TIM.2026.3661688
Last Modified:	03 Sep 2026 13:39
URI:	https://eprintspublications.npl.co.uk/id/eprint/10503