Schumacher, H W; Kück, S; Margolis, H S; Janssen, T J B M; Benz, S P; Kralj, N (2025) Editorial for the Special Topic: Advances in quantum metrology. Applied Physics Letters, 126 (22). 220401 ISSN 0003-6951

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Abstract

With the revision of the International System of Units (SI) in 2019, quantum metrology has become the foundation of all physical measurements. The seven SI base units are now defined by fixed values of seven so-called defining constants. This step change in metrology allows the SI-traceable realisation of identical measurement quantum standards in virtually every laboratory, which are precise, intrinsically stable and do not require calibration. While some quantum standards, such as Cs atomic clocks, Josephson voltage standards and quantum Hall resistance standards, are well established, others, such as quantum current sources based on dual Shapiro steps, have yet to reach practical use. In addition, quantum metrology is enabling more sensitive measurements using quantum effects such as squeezing to reduce noise, opening up applications such as ultra-precise geodesy, gravimetry, gravitational wave detection, magnetometry and even quantum gravity tests. Furthermore, the advancement of quantum applications such as quantum computing creates the need for reliable metrology of such quantum systems, components and devices.

This special topic collection of articles addresses several of the above issues to promote the further development of the field of quantum metrology. Both fundamental aspects of quantum metrology and future applications of quantum-based measurements are discussed and investigated.

Item Type:	Article
Subjects:	Quantum Phenomena > Quantum Information Processing and Communication
Divisions:	Time & Frequency
Identification number/DOI:	10.1063/5.0280635
Last Modified:	24 Mar 2026 15:12
URI:	https://eprintspublications.npl.co.uk/id/eprint/10358