Report/Guide

Tong, V; Mingard, K P; Adamski, F; Beausir, B; Bruckbauer, J; Cios, G; Dingley, D; Fullwood, D; Kalacska, S; Koko, A; McLean, M; Osborn, W; Radi, N; Schwedt, A; Shi, Q; Stacey, B; Wang, Y; Winklemann, A (2026) Interlaboratory comparison of strain measurement by high resolution electron backscatter diffraction. NPL Report. MAT 137

Article

Winklemann, A; Jablon, B M; Tong, V S; Troger-Cowan, C; Mingard, K P (2020) Improving EBSD precision by orientation refinement with full pattern matching. Journal of Microscopy, 277 (2). pp. 79-92. ISSN 0022-2720