Winklemann, A; Jablon, B M; Tong, V S; Troger-Cowan, C; Mingard, K P (2020) Improving EBSD precision by orientation refinement with full pattern matching. Journal of Microscopy, 277 (2). pp. 79-92. ISSN 0022-2720
Full text not available from this repository.
Official URL: https://doi.org/10.1111/jmi.12870
Item Type: | Article |
---|---|
Subjects: | Advanced Materials > Microstructural Characterisation |
Divisions: | Engineering |
Identification number/DOI: | 10.1111/jmi.12870 |
Last Modified: | 25 Jun 2020 15:02 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/8753 |
Actions (login required)
![]() |
View Item |