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Improving EBSD precision by orientation refinement with full pattern matching

Winklemann, A; Jablon, B M; Tong, V S; Troger-Cowan, C; Mingard, K P (2020) Improving EBSD precision by orientation refinement with full pattern matching. Journal of Microscopy, 277 (2). pp. 79-92. ISSN 0022-2720

Full text not available from this repository.
Item Type: Article
Subjects: Advanced Materials > Microstructural Characterisation
Divisions: Engineering
Identification number/DOI: 10.1111/jmi.12870
Last Modified: 25 Jun 2020 15:02
URI: http://eprintspublications.npl.co.uk/id/eprint/8753

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