Conference or Workshop Item

Votsi, H*; Roch-Jeune, I*; Haddadi, K*; Li, C*; Dambrine, G*; Aaen, P H*; Ridler, N M (2016) Development of a reference wafer for on-wafer testing of extreme impedance devices. In: 88th ARFTG Microwave Measurement Conference (ARFTG), 8-9 December 2016, Austin, Tx, USA.