Pelster, A*; Tyler, B J; Korsgen, M*; Kassenbohmer, R*; Peterson, R E*; Stover, M*; Unger, W E S*; Arlinghaus, H F* (2016) Improved 3D-imaging of a sirolimus/probucol eluting stent coating using laser positionization secondary neutral mass spectrometry and time-of-flight secondary ion mass spectrometry. Biointerphases, 11 (4). 041001

Fischer, T*; Dietrich, P M*; Streeck, C*; Ray, S; Nutsch, A*; Shard, A G; Beckoff, B*; Unger, W E S*; Rurack, K* (2015) Quantification of variable functional-group densitites of mixed-silane monolayers on surfaces via a duel-mode fluorescence and XPS label. Anal. Chem., 87 (5). pp. 2685-2692.

Holzweber, M*; Shard, A G; Jungnickel, H*; Luch, A*; Unger, W E S* (2014) Duel beam organic profiling using large argon cluster ion beams. Surf. Interface Anal., 46 (10-11). pp. 936-939.

Burke, T*; Leach, R K; Boyd, R; Gee, M G; Roy, D; Yacoot, A; Ulrich-Danzebrink, H*; Dziomba, T*; Koenders, L*; Depero, L E*; Carneiro, K*; Dirschel, K*; Morazzani, V*; Lausmaa, J*; Pendrill, L*; Pidduck, A*; Roebben, G*; Sánchez, A*; Unger, W E S*; Proykova, A* (2011) European Nanometrology 2020. Technical Report. Co-Nanomet.

Leach, R K; Boyd, R; Burke, T*; Danzebrink, H-U*; Dirscherl, K*; Dziomba, T*; Gee, M G; Koenders, L*; Morazzani, V*; Pidduck, A*; Roy, D; Unger, W E S*; Yacoot, A (2011) The European nanometrology landscape. Nanotechnology, 22. 062001

Dietrich, P M*; Horlacher, T*; Gross, T*; Wirth, T*; Castelli, R*; Shard, A G; Alexander, M*; Seeberger, P H*; Unger, W E S* (2010) Surface analytical characterization of carbohydrate microarrays. Surf. Interface Anal., 42 (6-7). pp. 1188-1192.

Seah, M P; Unger, W E S*; Hai Wang*,; Jordaan, W*; Gross, Th*; Dura, J A*; Dae Won Moon*,; Totarong, P*; Krumrey, M*; Hauert, R*; Mo Zhiqiang* (2009) Ultra thin SiO2 on Si IX: Absolute Measurements of the Amount of silicon oxide as a thickness of SiO2 on Si. Surf. Interface Anal., 41 (5). pp. 430-439.