Report/Guide

Reilly, S (2003) High resolution reflectometry techniques. Capabilities and calibration requirements. NPL Report. CETM 47

Article

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2006) Recent advances in traceable nanoscale dimension and force metrology in the UK. Meas. Sci. Technol., 17. pp. 467-476.

Conference or Workshop Item

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2005) Recent advances in traceable nanoscale dimension and force metrology in the UK. In: ISMTII 2005 - 7th International Symposium Series on Measurement Technology and Intelligent Instruments., 6-8 September 2005, Huddersfield, UK.