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Heaps, E; Yacoot, A; Dongmo, H; Picco, L; Payton, O D; Russell-Pavier, F; Klapetek, P (2020) Bringing real-time traceability to high-speed atomic force microscopy. Measurement Science and Technology, 31 (7). 074005 ISSN 0957-0233

Russell-Pavier, F S; Picco, L; Day, J C C; Shatil, N R; Yacoot, A; Payton, O D (2018) ‘Hi-Fi AFM’: high-speed contact mode atomic force microscopy with optical pickups. Measurement Science and Technology, 29 (10). 105902 ISSN 0957-0233