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Items where Author is "Ofiare, A."
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Conference or Workshop Item
Kelly, J.; Wang, J.; Ofiare, A.; Ridler, N M; Li, C. (2025) Evaluation of On-Wafer Noise Parameter Measurement Techniques at Cryogenic Temperatures. In: 2025 104th ARFTG Microwave Measurement Conference (ARFTG), 19-22 January 2025, San Juan, PR, USA.