Article

Lancaster, A J; O'Connor, D (2022) Traceable spectral interferometry for length measurement. Metrologia, 59 (2). 024004

Przyklenk, A; Balsamo, A; O'Connor, D; Evans, A; Yandayan, T; Akgoz, S A; Flys, O; Phillips, D; Zeleny, V; Czulek, D; Meli, F; Ragusa, C S; Bosse, H (2021) New European Metrology Network for advanced manufacturing. Measurement Science and Technology, 32 (11). 111001

Jones, C W; O'Connor, D (2018) A hybrid 2D/3D inspection concept with smart routing optimisation for high throughput, high dynamic range and traceable critical dimension metrology. Measurement Science and Technology, 29 (7). 074004

Wood, S; O'Connor, D; Jones, C W; Claverley, J D; Blakesley, J C; Giusca, C; Castro, F A (2017) Transient photocurrent and photovoltage mapping for characterization of defects in organic photovoltaics. Sol. Energy Mater. Sol. Cells, 161. pp. 89-95.

McPolin, C P T*; Olivier, N*; Bouillard, J S*; O'Connor, D; Krasavin, A V*; Dickson, W*; Wurtz, G A*; Zayats, A V* (2017) Universal switching of plasmonic signals using optical resonator modes. Light-Science Applications, 6. e16237

McPolin, C P T*; Bouillard, J S*; Vilain, S*; Krasavin, A V*; Dickson, W*; O'Connor, D; Wurtz, G A*; Justice, J*; Corbett, B*; Zayats, A V* (2016) Integrated plasmonic circuitry on a vertical-cavity surface-emitting semiconductor laser platform. Nature Comms., 7. p. 12409.

Moschetti, G; Forbes, A B; Leach, R K*; Jiang, X*; O'Connor, D (2016) Phase and fringe order determination in wavelength scanning interferometry. Opt. Express, 24 (8). pp. 8997-9012.

Moschetti, G; Forbes, A B; Leach, R K*; Jiang, X*; O'Connor, D (2016) Quadrature wavelength scanning interferometry. Appl. Opt., 55 (20). pp. 5332-5340.

Dickson, W*; Beckett, S*; McClatchey, C*; Murphy, A*; O'Connor, D; Wurtz, G A*; Pollard, R*; Zayats, A V* (2015) Hyperbolic polaritonic crystals based on nanostructured nanorod materials. Adv. Mater., 27 (39). pp. 5974-5980.

O'Connor, D; Henning, A J; Sherlock, B; Leach, R K; Coupland, J*; Giusca, C L (2015) Model-based defect detection on structured surfaces having optically unresolved features. Appl. Opt., 54 (30). pp. 8872-8877.

Leach, R K; Evans, C*; He, L*; Davies, A*; Duparre, A*; Henning, A J; Jones, C W; O'Connor, D (2015) Open questions in surface topography measurement: a roadmap. Surf. Topogr.: Metrol. Prop., 3 (1). 013001

Conference or Workshop Item

O'Connor, D; Evans, A; Balsamo, A; Favre, G; Przyklenk, A; Bosse, H; Phillips, D (2023) European Metrology Network (EMN) for Advanced Manufacturing ─ Development of the Strategic Research Agenda (SRA). In: euspen's 23rd International Conference & Exhibition, 12-16 June 2023, Copenhagan, Denmark.