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Burton, O J; Massabuau, F C P; Veigang-Radulescu, V P; Brennan, B; Pollard, A J; Hofmann, S (2020) Integrated Wafer Scale Growth of Single Crystal Metal Films and High Quality Graphene. ACS Nano, 14 (10). pp. 13593-13601. ISSN 1936-0851