Lorang, G*; Langeron, J P*; Seah, M P (1996) 'In situ' preparation and characterisation (AES, XPS) of thin thermal oxide films as material standards for an AES data bank. In: ECASIA 95, European Conference on Applications of Surface and Interface Analysis, 1996.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1996) An absolute high resolution digital Auger electron reference databases. In: ECASIA 95, European Conference on Applications of Surface and Interface Analysis, 1996.

Lorang, G*; Langeron, J P*; Seah, M P (1995) 'In situ' preparation and characterisation (AES, XPS) of thin thermal oxide films as materials standards for an AES data bank. In: ECASIA 95 - European Conference on Applications of Surface and Interface Analysis, 9-13 October 1995, Monreaux, Switzerland.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1995) An absolute, high resolution digital auger electron reference database. In: ECASIA 95 European Conference on Applications of Surface and Interface Analysis, 9 - 13 October 1995, Montreaux, Switzerland.