Garcia-Diez, R*; Sikora, A; Gollwitzer, C*; Minelli, C; Krumrey, M* (2016) Simultaneous size and density determination of polymeric colloids by continuous contrast variation in small angle x-ray scattering. Eur. Polym. J., 81. pp. 641-649.

Gollwitzer, C*; Bartczak, D*; Geonaga-Infante, H*; Kestens, V*; Krumrey, M*; Minelli, C; Palmai, M*; Ramaye, Y*; Roebben, G*; Sikora, A; Varga, Z* (2016) A comparison of techniques for size measurement of nanoparticles in cell culture medium. Anal. Methods, 8 (26). pp. 5272-5282.

Geissler, D*; Gollwitzer, C*; Sikora, A; Minelli, C; Krumrey, M*; Resch-Genger, U* (2015) Effect of fluorescent staining on size measurements of polymeric nanoparticles using DLS and SAXS. Anal. Methods, 7 (23). pp. 9785-9790.

Roebben, G*; Kestens, V*; Varga, Z*; Charoud-Got, J*; Ramaye, Y*; Gollwitzer, C*; Bartczak, D*; Geissler, D*; Noble, J; Mazoua, S*; Meeus, N*; Corbisier, P*; Palmai, M*; Mihaly, J*; Krumrey, M*; Davies, J*; Resch-Genger, U*; Kumarswami, N; Minelli, C; Sikora, A; Goenaga-Infante, H* (2015) Reference materials and representative test materials to develop nanoparticle characterization methods: the NanoChOp project case. Frontiers in Chemistry, 3. p. 56.

Minelli, C; Garcia-Diez, R*; Sikora, A E; Gollwitzer, C*; Krumrey, M*; Shard, A G (2014) Characterization of IgG-protein-coated polymeric nanoparticles using complementary particle sizing techniques. Surf. Interface Anal., 46 (10-11). pp. 663-667.

Wernecke, J*; Shard, A G; Krumrey, M* (2014) Traceable thickness determination of organic nanolayers by X-ray reflectometry. Surf. Interface Anal., 46 (10-11). pp. 911-914.

Meli, F*; Klein, T*; Buhr, E*; Frase, C G*; Gleber, G*; Krumrey, M*; Duta, A*; Duta, S*; Korpelainen, V*; Bellotti, R*; Picotto, G B*; Boyd, R D; Cuenat, A (2012) Traceable size determination of nanoparticles, a comparison among European metrology institutes. Meas. Sci. Technol., 23 (12). 125005

Boyd, R D; Cuenat, A; Meli, F*; Klein, T*; Frase, C G*; Gleber, G*; Krumrey, M*; Duta, A*; Duta, S*; Hogstrom, R*; Prieto, E* (2011) Good practice guide for the determination of the size distributions of spherical nanoparticle samples. Measurement Good Practice Guide. 119

Hansen, P-E*; Roebben, G*; Babick, F*; Boyd, R; Braun, A*; Busch, I*; Danzebrink, H-U*; Depero, L*; Dirscherl, K*; Dziomba, T*; Eriksson, E*; Franks, K*; Gee, M G; Jennett, N M; Kestens, V*; Koenders, L*; Krumrey, M*; Lausmaa, J*; Leach, R K; Pendrill, L*; Pidduck, A*; Put, S*; Roy, D; Stintz, M*; Turan, R*; Yacoot, A (2010) Introductory guide to nanometrology. Technical Report. European Commission.

Seah, M P; Unger, W E S*; Hai Wang*,; Jordaan, W*; Gross, Th*; Dura, J A*; Dae Won Moon*,; Totarong, P*; Krumrey, M*; Hauert, R*; Mo Zhiqiang* (2009) Ultra thin SiO2 on Si IX: Absolute Measurements of the Amount of silicon oxide as a thickness of SiO2 on Si. Surf. Interface Anal., 41 (5). pp. 430-439.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinlander, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyun Mo Cho*,; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Baily, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36 (9). pp. 1269-1303.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinländer, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyan Mo Cho*,; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Bailey, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36. pp. 1269-1303.