Jones, C W; Sun, W J; Boulter, H; Brown, S (2022) 3D roughness standard for performance verification of topography instruments for additively-manufactured surface inspection. Measurement Science and Technology, 33 (8). 084003

Sun, W; Chen, X; Giusca, C; Lou, S; Jones, C W; Boulter, H; Brown, S (2022) Evaluation of X-ray computed tomography for surface texture measurements using a prototype additively manufactured reference standard. In: 11th Conference on Industrial Computed Tomography (iCT 2022), 08-11 February 2022, Wels, Austria.

Jones, C W; O'Connor, D (2018) A hybrid 2D/3D inspection concept with smart routing optimisation for high throughput, high dynamic range and traceable critical dimension metrology. Measurement Science and Technology, 29 (7). 074004

Wood, S; O'Connor, D; Jones, C W; Claverley, J D; Blakesley, J C; Giusca, C; Castro, F A (2017) Transient photocurrent and photovoltage mapping for characterization of defects in organic photovoltaics. Sol. Energy Mater. Sol. Cells, 161. pp. 89-95.

Leach, R K; Evans, C*; He, L*; Davies, A*; Duparre, A*; Henning, A J; Jones, C W; O'Connor, D (2015) Open questions in surface topography measurement: a roadmap. Surf. Topogr.: Metrol. Prop., 3 (1). 013001

Leach, R K; Jones, C W; Sherlock, B; Krysinski, A* (2013) Metrology challenges for highly parallel micro-manufacture. In: 4M 2013 - Proceedings of the 10th International Conference on Multi-Material Micro Manufacture., 8-10 October 2013, San Sebastian, Spain.

Leach, R K; Jones, C W; Sherlock, B; Krysinski, A* (2013) The high dynamic range surface metrology challenge. In: 28th Annual Meeting of the American Society for Precision Engineering., 20-25 October 2013, St. Paul, Minnesota, USA.

Leach, R K; Claverley, J D; Giusca, C; Jones, C W; Nimishakavi, L P; Sun, W; Tedaldi, M; Yacoot, A (2012) Advances in engineering nanometrology at the National Physical Laboratory. Meas. Sci. Technol., 23 (7). 074002

Burt, D P*; Dobson, P S*; Docherty, K E*; Jones, C W; Leach, R K; Thoms, S*; Weaver, J M R*; Zhang, Y* (2012) Aperiodic interferometer for six degrees of freedom position measurement. Opt. Lett., 37 (7). pp. 1247-1249.

Kim, M-S*; Pratt, J R*; Brand, U*; Jones, C W (2012) Report on the first international comparison of small force facilities: a pilot study at the micronewton level. Metrologia, 49 (1). pp. 70-81.

Kim, M S*; Pratt, J R*; Brand, U*; Jones, C W (2012) Report on the first international comparison of small force facilities: a pilot study at the micronewton level. Metrologia, 49 (1). pp. 70-81.

Jones, C W; Chetwynd, D*; Singh, J*; Leach, R K (2011) Concept and modelling of a novel active triskelion low force transfer artefact. In: 11th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen 2011), 23-27 May 2011, Lake Como, Italy.

Leach, R K; Flack, D R; Hughes, E B; Jones, C W (2009) Development of a new traceable areal surface texture measuring instrument. Wear, 266. pp. 552-554.

Yacoot, A; Leach, R K; Hughes, B; Giusca, C; Jones, C W; Wilson, A (2009) Dimensional nanometrology at The National Physical Laboratory. Proc. SPIE - Int. Soc. Opt. Eng., 7133. pp. 713345-1.

Leach, R K; Jones, C W (2009) Towards a traceable infrastructure for low force measurements. IFIP International Federation for Information Processing, 260. pp. 307-314.

Jones, C W; Leach, R K (2008) Review of low force transfer artefact technologies. NPL Report. ENG 5

Jones, C W; Leach, R K (2008) Adding a dynamic aspect to amplitude-wavelength space. Meas. Sci. Technol., 19 (5). 055105

Jones, C W; Leach, R K (2008) Amplitude-wavelength space in three dimensions. In: 12th International Colloquium on Surfaces, 28-29 January 2008, Chemnitz, Germany.

Jones, C W; Davidson, S; Kramer, J A*; Leach, R K; Pratt, J R* (2008) Comparison of NIST SI force scale to NPL SI mass scale. In: ASPE 2008 Annual Meeting, 19-24 October 2008, Portland, Oregon.

Leach, R K; Flack, D R; Hughes, E B; Jones, C W (2007) Development of a new traceable areal surface texture measuring instrument. In: 11th International Conference on Metrology & Properties of Engineering Surfaces., 17-20 July 2007, Huddersfield, UK.