Article

Singh, D; Salter, M J; Johny, S; Ridler, N M (2022) Uncertainties in small-signal and large-signal measurements of RF amplifiers using a VNA. IEEE Instrumentation & Measurement Magazine, 25 (6). pp. 37-44.

Ridler, N M; Johny, S; Salter, M J; Shang, X; Sun, W; Wilson, A (2021) Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths. Metrologia, 58 (1). 015015 ISSN 0026-1394

Ridler, N M; Johny, S; Shang, X; Sun, W; Wilson, A (2020) Comparing Standardized and Manufacturers’ Interfaces for Waveguides Used at Submillimeter Wavelengths. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 453-459. ISSN 2156-342X

Conference or Workshop Item

Serghiou, D; Khalily, M; Johny, S; Stanley, M; Fatadin, I; Brown, T W C; Ridler, N; Tafazolli, R (2021) Comparison of Diffuse Roughness Scattering from Material Reflections at 500-750 GHz. In: 2021 15th European Conference on Antennas and Propagation, EuCap 2021, 22-26 March 2021, Dusseldorf, Germanay.