Wang, Y; Shang, X; Ridler, N M; Naftaly, M; Dimitriadis, A I; Huang, T; Wu, W (2020) Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 466-473. ISSN 2156-342X

Wang, Y; Shang, X; Ridler, N M; Huang, T; Wu, W (2020) Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique. IEEE Transactions on Instrumentation and Measurement, 69 (7). pp. 4930-4939. ISSN 0018-9456