Portoles, J F*; Cumpson, P J; Hedley, J*; Allen, S*; Williams, P M*; Tendler, S J B* (2006) Accurate velocity measurements of AFM-cantilever vibrations by doppler interferometry. J. Experimental Nanoscience, 1 (1). pp. 51-62.

Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

Cumpson, P J; Zhdan, P*; Hedley, J* (2004) Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs. Ultramicroscopy, 100. pp. 241-251.

Cumpson, P J; Hedley, J*; Clifford, C A; Chen, X*; Allen, S* (2004) Microelectromechanical systems device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m. J. Vac. Sci. Technol. A, 22 (4). pp. 1444-1449.

Cumpson, P J; Clifford, C A; Hedley, J* (2004) Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration. Meas. Sci. Technol., 15. pp. 1337-1346.

Hedley, J*; Burdess, J S*; Harris, A J*; Gallacher, B J*; McNeil, C J*; Cumpson, P J; Enderling, S* (2004) An optical workstation for characterisation and modification of MEMS. Proc. SPIE - Int. Soc. Opt. Eng., 5458. pp. 244-252.

Cumpson, P J; Hedley, J* (2003) Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI. Nanotechnology, 14. pp. 1279-1288.

Cumpson, P J; Hedley, J*; Zhdan, P* (2003) Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibrations. Nanotechnology, 14. pp. 918-924.