Conference or Workshop Item

Smale, D*; Haley, S*; Segal, J*; Ronaldo, R*; Ratchev, S*; Leach, R K; Claverley, J D (2010) Utilisation of FIB/SEM technology in the assembly of an innovative micro-CMM probe. In: 5th International Precision Assembly Seminar (IPAS 2010), February 2010, Chamonix, France.