Article

Zhang, F; Wang, Z; Loh, T H; Gui, Y; Tang, S; Fan, W (2024) Multiprobe-enabled over-the-air calibration of millimeter-wave antenna array: concept and experimental validation. IEEE Antennas and Propagation Magazine, 66 (4). pp. 14-25.

Fatadin, I; Smith, J; Gui, Y; Nickeleit, I; Park, J; Hesler, J L (2024) Demonstration of 120 Gbit/s 64-QAM Wireless Link Operating in the 300 GHz Band. IEEE Access, 12. pp. 31159-31167.

Gui, Y; Unnikrishnan, D; Stanley, M; Fatadin, I (2022) Metrology Challenges in Quantum Key Distribution. Journal of Physics: Conference Series, 2416. 012005

Stanley, M; Gui, Y; Unnikrishnan, D; Hall, S R G; Fatadin, I (2022) Recent Progress in Quantum Key Distribution Network Deployments and Standards. Journal of Physics: Conference Series, 2416. 012001

Heliot, F; Loh, T H; Cheadle, D; Gui, Y; Dieudonne, M (2022) An Empirical Study of the Stochastic Nature of Electromagnetic Field Exposure in Massive MIMO Systems. IEEE Access, 10. pp. 63100-63112.

Conference or Workshop Item

Gui, Y; Loh, T H; Borrill, J (2025) Near-Field Evaluation of an Radiated-Two-Stage- Based Millimeter-Wave 5G New-Radio Multiple- Input-Multiple-Output Over-the-Air Test System. In: 2025 19th European Conference on Antennas and Propagation (EuCAP), 31 March 2025 - 04 April 2025, Stockholm, Sweden.

Gui, Y; Loh, T H; Heliot, F; Khalily, M; Tafazolli, R (2024) A Channel Sounding-based Radiation Pattern Measurement Technique for Simultaneous Multibeam Excitation of Millimeter-Wave Hybrid Beamformer With a Large Antenna Array. In: 4th URSI AT-RASC, 19-24 May 2024, Gran Canaria.

Gui, Y; Loh, T H (2023) A Realisation of Channel Emulation in a Reverberation Chamber method for Over-the-Air Compliance Testing in Support of 3GPP Standardisation. In: 2023 17th European Conference on Antennas and Propagation (EuCAP), 26-31 March 2023, Florence, Italy.

Book Chapter/Section

Heliot, F; Cheadle, D; Gui, Y; Loh, T H (2021) Metrology for RF Exposure from Massive MIMO system. In: Metrology for 5G and Emerging Wireless Technologies. IET, pp. 675-701. ISBN 9781839532788