Publications
Items where Author is "Gotz, M"
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Giblin, S P; Drung, D; Gotz, M; Scherer, H (2019) Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty. IEEE Transactions on Instrumentation and Measurement, 68 (6). pp. 1996-2002. ISSN 0018-9456
Conference or Workshop Item
Giblin, S P; Gotz, M; Scherer, H (2018) Inter-Laboratory Nanoamp Current Comparison with Sub-Part-Per-Million Uncertainty. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.
Giblin, S P; Gotz, M; Scherer, H (2018) Inter-Laboratory Nanoamp Current Comparison with Sub-Part-Per-Million Uncertainty. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.