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Inter-Laboratory Nanoamp Current Comparison with Sub-Part-Per-Million Uncertainty

Giblin, S P; Gotz, M; Scherer, H (2018) Inter-Laboratory Nanoamp Current Comparison with Sub-Part-Per-Million Uncertainty. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: Quantum Phenomena > Nanophysics
Divisions: Quantum Science
Identification number/DOI: 10.1109/cpem.2018.8501254
Last Modified: 10 Jan 2019 14:13
URI: http://eprintspublications.npl.co.uk/id/eprint/8218

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