Article

Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1999) Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits. IEE Proc. Sci. Meas. Technol., 146 (3). pp. 117-122.

Gifford, A D; Humphreys, D A; Hale, P D* (1995) A comparison of photodiode frequency response measurements to 40 GHz between NPL and NIST. Electron. Lett., 31 (5). 397 -398

Hale, P D*; Humphreys, D A; Gifford, A D (1994) Photodetector frequency response measurements at NIST, US and NPL, UK: preliminary results of a standards laboratory comparison. Proc. SPIE - Int. Soc. Opt. Eng., 2149. pp. 345-356.

Conference or Workshop Item

Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1997) Electro-optic probing of microwave circuits. In: BEMC '97 8th International Conference on Electromagnetic Measurement Digest, 4-6 November 1997, National Physical Laboratory, Teddington.

Roddie, A G; Smith, A J A; Gifford, A D; Henderson, D (1995) Application of femosecond pulses to electrical metrology. In: BEMC 95 7th British Electromagnetic Measurements Conference Digest, 6-9 November 1995, Malvern.