Conference or Workshop Item

Lobera, J*; Gao, F*; Coupland, J*; Leach, R K (2008) Limitations and innovations in scanning white light interferometry. In: euspen 2008, 18-22 May 2008, Zurich.

Gao, F*; Petzing, J N*; Coupland, J M*; Leach, R K (2007) Measurement of structured surfaces using stylus AFM and optical methods. In: 7th International Conference and 9th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 17-20 July 2007, Huddersfield, UK.