Article

Eio, C P; Gentle, D G; Fernandez, A; Le Sage, Y*; Kleine-Ostmann, T*; Camell, D*; Borsero, M*; Vizio, G*; Pythoud, F*; Muhlemann, B*; Drazil, K*; Zhao, D*; Ji, Y*; Kang, N W*; Li, D*; Xie, M*; Morioka, T*; Hirose, M*; Kolotygin, S*; Neustroev, S*; Cetintas, M*; Sen, O* (2013) Final report of key comparison CCEM.RF-K24.F e-field measurements at frequencies of 1GHz, 2.45 GHz, 10 GHz and 18 GHz and at indicated field levels of 10V/m, 30 V/m and 100 V/m. Metrologia, 50 (1A). 01007.

Eio, C P; Protheroe, S; Ridler, N M (2006) Characterising beadless air lines as reference artefacts for S-parameter measurements at RF and microwave frequencies. IEE Proc. Sci. Meas. Technol., 153 (6). pp. 229-234.

Cox, M G; Eio, C P; Mana, G*; Pennecchi, F* (2006) The generalized weighted mean of correlated quantities. Metrologia, 43. S268-S275

Conference or Workshop Item

Stenarson, J*; Eio, C P; Yhland, K* (2014) A calibration procedure for electronic calibration units. In: 84th ARFTG Microwave Measurement Conference, 4-5 December 2014, Boulder, CO, USA.

Eio, C P (2012) A look at the sensitivity of the thru-reflect-line vector network analyzer calibration algorithm. In: 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012), 1-6 July 2012, Washington DC, USA.

Eio, C P; Cox, M G (2006) Problems of correlation in key comparisons. In: CPEM 2006 Conference on Precision Electromagnetic Measurements, 9-14 July 2006, Torino, Italy.

Eio, C P; Cox, M G (2006) Problems of correlation in key comparisons. In: CPEM 2006 Conference on Precision Electromagnetic Measurements, 9-14 July 2006, Torino, Italy.

Eio, C P; Ridler, N M (2005) Characterising air lines using VNA loss measurements. In: BEMC 2005 - British Electromagnetic Measurements Conference, 14-17 November 2005, NPL, UK.