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A look at the sensitivity of the thru-reflect-line vector network analyzer calibration algorithm.

Eio, C P (2012) A look at the sensitivity of the thru-reflect-line vector network analyzer calibration algorithm. In: 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012), 1-6 July 2012, Washington DC, USA.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Identification number/DOI: 10.1109/CPEM.2012.6250640
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5569

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