Eio, C P (2012) A look at the sensitivity of the thru-reflect-line vector network analyzer calibration algorithm. In: 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012), 1-6 July 2012, Washington DC, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Identification number/DOI: | 10.1109/CPEM.2012.6250640 |
Last Modified: | 02 Feb 2018 13:14 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/5569 |
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