Britton, T B*; Maurice, C*; Fortunier, R*; Driver, J H*; Day, A P*; Meaden, G*; Dingley, D J*; Mingard, K P; Wilkinson, A J* (2010) Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. Ultramicroscopy, 110 (12). pp. 1443-1453.