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Items where Author is "Dimitriadis, A I"

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Wang, Y; Shang, X; Ridler, N M; Naftaly, M; Dimitriadis, A I; Huang, T; Wu, W (2020) Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 466-473. ISSN 2156-342X

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